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IEEE Symposium on Visual Analytics Science and Technology, 2008: Proceedings, Columbus, Ohio, USA, October 21-October 23, 2008
IEEE Symposium on Visual Analytics Science and Technology, 2008: Proceedings, Columbus, Ohio, USA, October 21-October 23, 2008
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2008, IEEE Computer Society Press
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2008, IEEE Computer Society Press
Paperback,
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1424429358
ISBN-13:
9781424429356
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222
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IEEE Computer Society Press
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2008
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English
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2008,
IEEE Computer Society Press
ISBN-13: 9781424429356
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